- Home
- Search Results
- Page 1 of 1
Search for: All records
-
Total Resources5
- Resource Type
-
0003000002000000
- More
- Availability
-
50
- Author / Contributor
- Filter by Author / Creator
-
-
Danial, Josef (5)
-
Das, Debayan (5)
-
Ghosh, Santosh (5)
-
Golder, Anupam (5)
-
Sen, Shreyas (5)
-
Raychowdhury, Arijit (4)
-
Chang, Muya (2)
-
Chatterjee, Baibhab (2)
-
Maity, Shovan (2)
-
Mathew, Sanu (2)
-
Modak, Nirmoy (2)
-
Krishnamurthy, Harish (1)
-
Krishnamurthy, Harish K. (1)
-
Seo, Dong-Hyun (1)
-
Seo, Donghyun (1)
-
Varna, Avinash (1)
-
Varna, Avinash L. (1)
-
Wdhury, Arijit Raycho (1)
-
#Tyler Phillips, Kenneth E. (0)
-
#Willis, Ciara (0)
-
- Filter by Editor
-
-
null (3)
-
& Spizer, S. M. (0)
-
& . Spizer, S. (0)
-
& Ahn, J. (0)
-
& Bateiha, S. (0)
-
& Bosch, N. (0)
-
& Brennan K. (0)
-
& Brennan, K. (0)
-
& Chen, B. (0)
-
& Chen, Bodong (0)
-
& Drown, S. (0)
-
& Ferretti, F. (0)
-
& Higgins, A. (0)
-
& J. Peters (0)
-
& Kali, Y. (0)
-
& Ruiz-Arias, P.M. (0)
-
& S. Spitzer (0)
-
& Sahin. I. (0)
-
& Spitzer, S. (0)
-
& Spitzer, S.M. (0)
-
-
Have feedback or suggestions for a way to improve these results?
!
Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher.
Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?
Some links on this page may take you to non-federal websites. Their policies may differ from this site.
-
Golder, Anupam; Das, Debayan; Danial, Josef; Ghosh, Santosh; Sen, Shreyas; Raychowdhury, Arijit (, IEEE Transactions on Very Large Scale Integration (VLSI) Systems)
-
Das, Debayan; Danial, Josef; Golder, Anupam; Modak, Nirmoy; Maity, Shovan; Chatterjee, Baibhab; Seo, Dong-Hyun; Chang, Muya; Varna, Avinash L.; Krishnamurthy, Harish K.; et al (, IEEE Journal of Solid-State Circuits)
-
Das, Debayan; Golder, Anupam; Danial, Josef; Ghosh, Santosh; Raychowdhury, Arijit; Sen, Shreyas (, DAC '19: Proceedings of the 56th Annual Design Automation Conference 2019)null (Ed.)This article, for the first time, demonstrates Cross-device Deep Learning Side-Channel Attack (X-DeepSCA), achieving an accuracy of > 99.9%, even in presence of significantly higher inter-device variations compared to the inter-key variations. Augmenting traces captured from multiple devices for training and with proper choice of hyper-parameters, the proposed 256-class Deep Neural Network (DNN) learns accurately from the power side-channel leakage of an AES-128 target encryption engine, and an N-trace (N ≤ 10) X-DeepSCA attack breaks different target devices within seconds compared to a few minutes for a correlational power analysis (CPA) attack, thereby increasing the threat surface for embedded devices significantly. Even for low SNR scenarios, the proposed X-DeepSCA attack achieves ∼ 10× lower minimum traces to disclosure (MTD) compared to a traditional CPA.more » « less
-
Das, Debayan; Danial, Josef; Golder, Anupam; Modak, Nirmoy; Maity, Shovan; Chatterjee, Baibhab; Seo, Donghyun; Chang, Muya; Varna, Avinash; Krishnamurthy, Harish; et al (, 2020 IEEE International Solid- State Circuits Conference - (ISSCC))null (Ed.)
An official website of the United States government
